Ion-Implanted-Silicon Charged-Particle Detectors
• The standard for charged-particle detector spectroscopy.
• Ultra-thin entrance contact for optimum energy resolution.
• High geometric efficiency due to close detector-to-can spacing.
• Rugged and reliable.
• Gold-plated cans for contacts that last a lifetime.
• Advanced surface passivation for total device stability.
• ORTEC quality and reliability. • Bakeable up to 200°C (requires special order).